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Atomistic Study of lateral Charge Diffusion Degradation During Program/Erase Cycling in 3-D NAND Flash memory

2019-06-28

Authors: Wu, JX; Chen, JZ; Jiang, XW
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
Volume: 7 Issue: 1 Pages: 626-631 Published: 2019 Language: English Document type: Article
DOI: 10.1109/JEDS.2019.2920024
全文鏈接:https://ieeexplore.ieee.org/document/8726081



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