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[黃昆論壇]第342期:Cost-Effective Techniques for Analog Design, Analog Fault Coverage, and Fast and Accurate Testing of High Resolution ADCs

2019-05-31

報告題目:Cost-Effective Techniques for Analog Design, Analog Fault Coverage, and Fast and Accurate Testing of High Resolution ADCs

報告人:Prof. Degang Chen (IEEE Fellow, Junkins Chair Professor of Electrical and Computer Engineering, Iowa State University, USA)

報告時間:2019年6月11日(星期二) 上午10:00

報告地點:中國科學院半導體研究所2號樓303A會議室



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